Süßmann, F.; Stebbings, S. L.; Zherebtsov, S.; Chew, S. H.; Stockman, M. I.; Rühl, E.; Kleineberg, U.; Fennel, T.; Kling, M. F.: Attosecond Nanophysics. In: Attosecond and XUV Physics, S. 421 - 461 (Hg. Schultz, T.; Vrakking, M.). Wiley-VCH, Weinheim (2014)

Cavalieri, A. L.; Krausz, F.; Ernstorfer, R.; Kienberger, R.; Feulner, P.; Barth, J. V.; Menzel, D.: Attosecond time-resolved spectroscopy at surfaces. In: Current Developments, S. 537 - 553 (Hg. Bovensiepen; U.; Petek, H.; Wolf, M.). Wiley-VCH, Weinheim (2010)

Keilmann, F.; Hillenbrand, R.: Near-field nanoscopy by elastic light scattering from a tip. In: Nano-Optics and Near-Field Optical Microscopy, S. 235 - 265 (Hg. Zayats, A.; Richards, D.). Artech House, Norwood, USA (2009)

Cundiff, S. T.; Krausz, F.; Fuji, T.: Carrier-Envelope Phase of Ultrashort Pulses. In: Strong Field Laser Physics, S. 61 - 89 (Hg. Brabec, T.). Springer, New York (2008)

Kienberger, R.; Krausz, F.: Progress in attosecond metrology. In: Ultrafast Optics V, S. 3 - 13 (Hg. Watanabe, S.; Midorikawa, K.). Springer, New York (2007)

Teisset, C. Y.; Ishii, N.; Fuji, T.; Metzger, T.; Köhler, S.; Holzwarth, R.; Baltuška, A.; Zheltikov, A. M.; Krausz, F.: Optical Synchronization for OPCPA chains. In: Ultrafast Optics V, S. 535 - 545 (Hg. Watanabe, S.; Midorikawa, K.). Springer, New York (2007)

Fuß, W.; Trushin, S. A.; Schmid, W. E.; Kosmidis, C.; Panja, S.: Dark Intermediate States in Photochemical Cis-Trans Isomerization and Pericyclic Reactions. In: Femtochemistry VII: Fundamental Ultrafast Processes in Chemistry, Physics, and Biology, S. 96 - 104 (Hg. Castleman, A.W.; Kimble, M.L.). Elsevier, Amsterdam (2006)

Kienberger, R.; Krausz, F.: Attosecond laser pulses. In: McGraw-Hill Yearbook of Science and Technology 2006, S. 19 - 22 (Hg. of of science, s. t. M.-H. e.; technology). McGraw-Hill, New York (2006)

Baltuška, A.; Paulus, G. G.; Lindner, F.; Kienberger, R.; Krausz, F.: Generation and Measurement of Intense Phase-Controlled Few-Cycle Laser Pulses. In: Femtosecond Optical Frequency Comb Technology: Principle, Operation and Application, S. 263 - 313 (Hg. Ye, J.; Cundiff, S. T.). Springer, New York (2005)

Baltuška, A.; Kobayashi, T.: Parametric Amplification and Phase Control of Few-Cycle Light Pulses. In: Few-Cycle Laser Pulse Generation and Its applications, S. 179 - 227 (Hg. Kärtner, F.X.). Springer, Berlin (2004)

Kienberger, R.; Krausz, F.: Subfemtosecond VUX Pulses: Attosecond Metrology and Spectroscopy. In: Few-Cycle Laser Pulse Generation and Its applications, S. 343 - 378 (Hg. Kärtner, F.X.). Springer, Berlin (2004)

Pshenichnikov, M. A.; Baltuška, A.; PshenichnikovWiersma, D. A.: Dynamics of a Photoexcited Hydrated Electron. In: Few-Cycle Laser Pulse Generation and Its applications, S. 409 - 444 (Hg. Kärtner, F.X.). Springer, Berlin (2004)

Trebino, R.; Baltuška, A.; Pshenichnikov, M. S.; Wiersma, D. A.: Measuring Ultrashort Pulses in the Single-Cycle Regime: Frequency-Resolved Optical Gating. In: Few-Cycle Laser Pulse Generation and Its applications, S. 231 - 263 (Hg. Kärtner, F.X.). Springer, Berlin (2004)

Tempea, G.; Yakovlev, V.; Krausz, F.: Interference Coatings for Ultrafast Optics. In: Optical Interference Coatings, S. 393 - 422 (Hg. Kaiser, N.; Pulker, H. K.). Springer, Heidelberg (2003)

Becker, W.; Grasbon, F.; Kopold, R.; Milošević, D. B.; Paulus, G. G.; Walther, H.: Above-threshold ionization: From classical features to quantum effects. In: ADVANCES IN ATOMIC, MOLECULAR, AND OPTICAL PHYSICS, VOL 48, S. 35 - 98 (Hg. Bederson, B.; Walther, H.). ACADEMIC PRESS INC, SAN DIEGO (2002)

Witte, K. J.; Tsakiris, G. D.; Gahn, C.; Pretzler, G.: MeV Electrons and Positrons from a Femtosecond Table-Top Laser system. In: Laser Physics at the Limits, S. 381 - 393 (Hg. Figger, H.; Meschede, D.; Zimmermann, C.). Springer, Berlin (2002)

Powerful THz sources based on laser wakefields. 5th International Conference on Inertial Fusion Sciences and Applications (IFSA 2007), Kobe, Japan, 09. September 2007 - 14. September 2007. (2008)

Amochkina, T.; Matusevich, V.; Trubetskov, M. K.: Reliable substrate characterization in the broadband range of 220-1700 nm based on spectral photometric data. In: Advances in Optical Thin Films VIII, 130200O. Conference on Advances in Optical Thin Films VIII, Strasbourg, FRANCE, 08. April 2024 - 11. April 2024. SPIE (2024)

Amochkina, T.; Shandarovich, V.; Kisela, D.; Trubetskov, M. K.; Myslivets, A.: Advanced characterization of IBAD deposited MgF₂, Al₂O₃, Si, YF₃, and Ge thin films in ultra-broadband spectral region of 300-5000 nm. In: Advances in Optical thin Films VIII, 130200R. Conference on Advances in Optical Thin Films VIII, Strasbourg, FRANCE, 08. April 2024 - 11. April 2024. SPIE (2024)

Amochkina, T.; Trubetskov, M. K.; Janicki, V.; Sancho-Parramon, J.: Reliable post-production characterization approach to TiO₂/SiO₂ electron-beam optical coatings based on multi-sample photometric and ellipsometric data. In: Advances in Optical Thin Films VIII, 130200S. Conference on Advances in Optical Thin Films VIII, Strasbourg, FRANCE, 08. April 2024 - 11. April 2024. SPIE (2024)