Publikationen von Ivan B. Angelov

Amotchkina, T. V.; Trubetskov, M. K.; Tikhonravov, A.; Angelov, I. B.; Pervak, V.: Reliable optical characterization of e-beam evaporated TiO₂ films deposited at different substrate temperatures. Applied Optics 53 (4), S. A8 - A15 (2013)

Angelov, I. B.; Trubetskov, M. K.; Yakovlev, V. S.; Razskazovskaya, O.; Gorjan, M.; Barros, H.G.; Krausz, F.; Pervak, V.: Ultrafast optical breakdown of multilayer thin-films at kHz and MHz repetition rates: a direct comparison. In: Proceedings of the SPIE, Bd. 9237, 92370H. Laser-Induced Damage in Optical Materials: 2014, Boulder, CO, USA, 14. September 2014 - 17. September 2014. SPIE (2014)

Trubetskov, M. K.; von Pechmann, M.; Angelov, I. B.; Razskazovskaya, O.; Vodopyanov, K.L.; Krausz, F.; Pervak, V.: Resonance scanning interferometer for group delay dispersion measurements. In: Lasers and Electro-Optics Europe (CLEO EUROPE/IQEC), 2013 Conference on and International Quantum Electronics Conference. 2013 Conference on Lasers & Electro-Optics. Europe & International Quantum Electronics Conference (CLEO EUROPE/IQEC), Munich, Germany, 12. Mai 2013 - 16. Mai 2013. IEEE (2013)