Publikationen von Michael K. Trubetskov

Fedulova, E.; Fritsch, K.; Brons, J.; Pronin, O.; Amotchkina, T.; Trubetskov, M. K.; Krausz, F.; Pervak, V.: Highly-dispersive mirrors reach new levels of dispersion. Optics Express 23 (11), S. 13788 - 13793 (2015)

Holzberger, S.; Lilienfein, N.; Trubetskov, M. K.; Carstens, H.; Lücking, F.; Pervak, V.; Krausz, F.; Pupeza, I.: Enhancement cavities for zero-offset-frequency pulse trains. Optics Letters 40 (10), S. 2165 - 2168 (2015)

Pronin, O.; Seidel, M.; Lücking, F.; Brons, J.; Fedulova, E.; Trubetskov, M. K.; Pervak, V.; Apolonskiy, A.; Udem, T.; Krausz, F.: High-power multi-megahertz source of waveform-stabilized few-cycle light. Nature Communications 6, 6998 (2015)

Zhang, J.; Cao, C.; Tikhonravov, A. V.; Trubetskov, M. K.; Gorokh, A.; Cheng, X.; Wang, Z.: Advantages and challenges of optical coating production with indirect monochromatic monitoring. Applied Optics 54 (11), S. 3433 - 3439 (2015)

Trubetskov, M. K.; Amotchkina, T.; Tikhonravov, A.: Automated construction of monochromatic monitoring strategies. Applied Optics 54 (8), S. 1900 - 1909 (2015)

Amotchkina, T.; Brauneck, U.; Tikhonravov, A.; Trubetskov, M. K.: Sensitivity-directed refinement for designing broadband blocking filters. Optics Express 23 (5), S. 5565 - 5570 (2015)

Tikhonravov, A. V.; Zhupanov, V. G.; Fedoseev, V. N.; Trubetskov, M. K.: Design and production of antireflection coating for the 8-10 µm spectral region. Optics Express 22 (26), S. 32174 - 32179 (2014)

Amotchkina, T.; Trubetskov, M. K.; Pervak, Y.; Veisz, L.; Pervak, V.: Stress compensation with antireflection coatings for ultrafast laser applications: from theory to practice. Optics Express 22 (24), S. 30387 - 30393 (2014)

Zhang, J.; Tikhonravov, A. V.; Liu, Y.; Trubetskov, M. K.; Gorokh, A.; Wang, Z.: Design, production and reverse engineering of ultra-steep hot mirrors. Optics Express 22 (11), S. 13448 - 13453 (2014)

Angelov, I. B.; von Pechmann, M.; Trubetskov, M. K.; Krausz, F.; Pervak, V.: Optical breakdown of multilayer thin-films induced by ultrashort pulses at MHz repetition rates. Optics Express 21 (25), S. 31453 - 31461 (2013)

Trubetskov, M. K.; Amotchkina, T.; Tikhonravov, A.; Pervak, V.: Reverse engineering of multilayer coatings for ultrafast laser applications. Applied Optics 53 (4), S. A114 - A120 (2013)

Jiao, H.; Cheng, X.; Bao, G.; Han, J.; Zhang, J.; Wang, Z.; Trubetskov, M. K.; Tikhonravov, A. V.: Study of HfO₂SiO₂ dichroic laser mirrors with refractive index inhomogeneity. Applied Optics 53 (4), S. A56 - A61 (2013)

Amotchkina, T. V.; Trubetskov, M. K.; Tikhonravov, A.; Angelov, I. B.; Pervak, V.: Reliable optical characterization of e-beam evaporated TiO₂ films deposited at different substrate temperatures. Applied Optics 53 (4), S. A8 - A15 (2013)

Amotchkina, T. V.; Trubetskov, M. K.; Tikhonravov, A. V.; Schlichting, S.; Ehlers, H.; Ristau, D.; Death, D.; Francis, R. J.; Pervak, V.: Quality control of oblique incidence optical coatings based on normal incidence measurement data. Optics Express 21 (18), S. 21508 - 21522 (2013)

Trubetskov, M. K.; von Pechmann, M.; Angelov, I. B.; Vodopyanov, K. L.; Krausz, F.; Pervak, V.: Measurements of the group delay and the group delay dispersion with resonance scanning interferometer. Optics Express 21 (6), S. 6658 - 6669 (2013)

Pervak, V.; Fedorov, V.; Pervak, Y. A.; Trubetskov, M. K.: Empirical study of the group delay dispersion achievable with multilayer mirrors. Optics Express 21 (15), S. 18311 - 18316 (2013)

Amotchkina, T. V.; Schlichting, S.; Ehlers, H.; Trubetskov, M.; Tikhonravov, A. V.; Ristau, D.: Computational manufacturing as a key element in the design-production chain for modern multilayer coatings. Applied Optics 51 (31), S. 7604 - 7615 (2012)

Tikhonravov, A. V.; Trubetskov, M. K.: Modern design tools and a new paradigm in optical coating design. Applied Optics 51 (30), S. 7319 - 7332 (2012)

Amotchkina, T. V.; Trubetskov, M. K.; Pervak, V.; Romanov, B.; Tikhonravov, A. V.: On the reliability of reverse engineering results. Applied Optics 51 (22), S. 5543 - 5551 (2012)

Amochkina, T.; Matusevich, V.; Trubetskov, M. K.: Reliable substrate characterization in the broadband range of 220-1700 nm based on spectral photometric data. In: Advances in Optical Thin Films VIII, 130200O. Conference on Advances in Optical Thin Films VIII, Strasbourg, FRANCE, 08. April 2024 - 11. April 2024. SPIE (2024)