Publications of Michael K. Trubetskov

Amochkina, T.; Shandarovich, V.; Kisela, D.; Trubetskov, M. K.; Myslivets, A.: Advanced characterization of IBAD deposited MgF₂, Al₂O₃, Si, YF₃, and Ge thin films in ultra-broadband spectral region of 300-5000 nm. In: Advances in Optical thin Films VIII, 130200R. Conference on Advances in Optical Thin Films VIII, Strasbourg, FRANCE, April 08, 2024 - April 11, 2024. SPIE (2024)

Amochkina, T.; Trubetskov, M. K.; Janicki, V.; Sancho-Parramon, J.: Reliable post-production characterization approach to TiO₂/SiO₂ electron-beam optical coatings based on multi-sample photometric and ellipsometric data. In: Advances in Optical Thin Films VIII, 130200S. Conference on Advances in Optical Thin Films VIII, Strasbourg, FRANCE, April 08, 2024 - April 11, 2024. SPIE (2024)

Benz, R.; Nazari, M.; Amochkina, T.; Trubetskov, M. K.: Optimizing Thin-Film Material Combinations for Immersed Narrow-Bandpass Filters in the VIS and NIR Range. In: Advances in Optical Thin Films VIII, 1302006. Conference on Advances in Optical Thin Films VIII, Strasbourg, FRANCE, April 08, 2024 - April 11, 2024. SPIE (2024)

Amotchkina, T. V.; Trubetskov, M. K.; Weigel, A.; Hahner, D.; Hussain, S. A.; Jacob , P.; Pupeza, I.; Pervak, V.: Fabry-Perot Based Temporal Standard at 8.5 mu m for Electro-Optic Delay Tracking. In: 2021 Conference on Lasers and Electro-Optics Europe / European Quantum Electronics Conference (CLEO/Europe-EQEC), 9542107. 2021 Conference on Lasers and Electro-Optics Europe / European Quantum Electronics Conference (CLEO/Europe-EQEC), ELECTR NETWORK, June 21, 2021 - June 25, 2021. IEEE (2021)

Weigel, A.; Buberl, T.; Jacob , P.; Amotchkina, T. V.; Hofer, C.; Trubetskov, M. K.; Sulzer, P.; Hussain, S. A.; Schweinberger, W.; Pervak, V. et al.; Krausz, F.; Pupeza, I.: Attosecond-Precision Dual-Oscillator Infrared Field-Resolved Spectroscopy Employing Electro-Optic Delay Tracking. In: 2021 Conference on Lasers and Electro-Optics Europe / European Quantum Electronics Conference (CLEO/Europe-EQEC), Vol. 2021, 9542397. 2021 Conference on Lasers and Electro-Optics Europe / European Quantum Electronics Conference (CLEO/Europe-EQEC), ELECTR NETWORK, June 21, 2021 - June 25, 2021. IEEE (2021)

Momggaudis, B.; Amotchkina, T. V.; Smalakys, L.; Trubetskov, M. K.; Pronin, O.; Krausz, F.; Pervak, V.; Melninkaitis, A.: Time resolved digital holography measurements of the nonlinear optical filters. In: Laser-Induced Damage in Optical Materials 2017, UNSP 104470Y (Eds. Exarhos, G. J.; Gruzdev, V. E.; Menapace, J. A.). SPIE Laser Damage, Boulder, CO, September 24, 2017 - September 27, 2017. (2017)

Amotchkina, T. V.; Trubetskov, M. K.; Fedulova, E.; Fritsch, K.; Pronin, O.; Krausz, F.; Pervak, V.: Characterization of Nonlinear Effects in Edge Filters. In: Optical Interference Coatings, Vol. 2016, ThD.3. Optical Interference Coatings 2016, Tuscon, Arizona, USA, June 16, 2016 - June 24, 2016. OSA (2016)

Trubetskov, M. K.; Amotchkina, T. V.; Lilienfein, N.; Holzberger, S.; Krausz, F.; Pupeza, I.; Pervak, V.: Design, Production and Characterization of Mirrors for Ultra-Broadband, High-Finesse Enhancement Cavities. In: Optical Interference Coatings, Vol. 2016, ThA.2. Optical Interference Coatings 2016, Tuscon, Arizona, USA, June 16, 2016 - June 24, 2016. OSA (2016)

Trubetskov, M. K.; Amotchkina, T.; Tikhonravov, A.; Veisz, L.; Pervak, V.: Design, production and reverse engineering of a double sided innovative thin film laser element. In: Optical Systems Design 2015: Advances in Optical Thin Films V, 96270X (Eds. Lequime, M.; Macleod, A. H.; Ristau, D.). Conference on Optical Systems Design - Advances in Optical Thin Films V, Jena, GERMANY, September 07, 2015 - September 10, 2015. Spie (2015)

Zhupanov, V.; Fedoseev, V.; Trubetskov, M. K.; Amotchkina, T.; Tikhonravov, A.: Design and production of three line antireflection coating for visible - far infrared spectral regions. In: Optical Systems Design 2015: Advances in Optical Thin Films V, 962706 (Eds. Lequime, M.; Macleod, A. H.; Ristau, D.). Conference on Optical Systems Design - Advances in Optical Thin Films V, Jena, GERMANY, September 07, 2015 - September 10, 2015. Spie (2015)

Keiber, S.; Sederberg, S.; Schwarz, A.; Razskazovskaya, O.; Trubetskov, M. K.; Pervak, V.; Krausz, F.; Karpowicz, N.: Electro-optic Sampling of Mid-to-Near-Infrared Waveforms. In: Conference on Lasers and Electro-Optics (CLEO), Vol. 2015, SW1H.2. Conference on Lasers and Electro-Optics (CLEO), San Jose, CA, May 10, 2015 - May 15, 2015. OSA (2015)

Trubetskov, M. K.: Multilayer Optics for Ultrafast Applications. In: Conference on Lasers and Electro-Optics (CLEO), Vol. 2015, AF1E.1. Conference on Lasers and Electro-Optics (CLEO), San Jose, CA, May 10, 2015 - May 15, 2015. OSA (2015)

Angelov, I. B.; Trubetskov, M. K.; Yakovlev, V. S.; Razskazovskaya, O.; Gorjan, M.; Barros, H.G.; Krausz, F.; Pervak, V.: Ultrafast optical breakdown of multilayer thin-films at kHz and MHz repetition rates: a direct comparison. In: Proceedings of the SPIE, Vol. 9237, 92370H. Laser-Induced Damage in Optical Materials: 2014, Boulder, CO, USA, September 14, 2014 - September 17, 2014. SPIE (2014)

Razskazovskaya, O.; Luu, T. T.; Trubetskov, M. K.; Goulielmakis, E.; Pervak, V.: Nonlinear behavior and damage of dispersive multilayer optical coatings induced by two-photon absorption. In: Proceedings of the SPIE, Vol. 9237, 92370L. Laser-Induced Damage in Optical Materials: 2014, Boulder, CO, USA, September 14, 2014 - September 17, 2014. SPIE (2014)

Trubetskov, M. K.; von Pechmann, M.; Angelov, I. B.; Razskazovskaya, O.; Vodopyanov, K.L.; Krausz, F.; Pervak, V.: Resonance scanning interferometer for group delay dispersion measurements. In: Lasers and Electro-Optics Europe (CLEO EUROPE/IQEC), 2013 Conference on and International Quantum Electronics Conference. 2013 Conference on Lasers & Electro-Optics. Europe & International Quantum Electronics Conference (CLEO EUROPE/IQEC), Munich, Germany, May 12, 2013 - May 16, 2013. IEEE (2013)