Publications of Thomas Becker

Liao, Z.; Al-Amri, M.; Becker, T.; Schleich, W. P.; Scully, M. O.; Zubairy, M. S.: Atom lithography with subwavelength resolution via Rabi oscillations. Physical Review A 87 (2), 023405 (2013)

Thoumany, P.; Becker, T.: Atomic hyperfine structure in micromaser physics. Optics Communications 285 (9), pp. 2382 - 2386 (2012)

Bernhardt, B.; Sorokin, E.; Jacquet, P.; Thon, R.; Becker, T.; Sorokina, I. T.; Picqué, N.; Hänsch, T. W.: Mid-infrared dual-comb spectroscopy with 2.4 μm Cr²⁺:ZnSe femtosecond lasers. Applied Physics B 100 (1 Sp. Iss. Sp. Iss. SI), pp. 3 - 8 (2010)

Johnson, L. A. M.; Majeed, H. O.; Sanguinetti, B.; Becker, T.; Varcoe, B. T. H.: Absolute frequency measurements of ⁸⁵Rb n F_7/2 Rydberg states using purely optical detection. New Journal of Physics 12, 063028 (2010)

Thoumany, P.; Hänsch, T. W.; Stania, G.; Urbonas, L.; Becker, T.: Optical spectroscopy of rubidium Rydberg atoms with a 297 nm frequency-doubled dye laser. Optics Letters 34 (11), pp. 1621 - 1623 (2009)

Thoumany, P.; Germann, T.; Hänsch, T. W.; Stania, G.; Urbonas, L.; Becker, T.: Spectroscopy of rubidium Rydberg states with three diode lasers. Journal of Modern Optics 56 (18-19 Sp. Iss.), pp. 2055 - 2060 (2009)

Klembovsky, M. P.; Gorodetsky, M. L.; Becker, T.: Atomic interferometry in high-Q toroidal microwave cavity. Physics Letters A 372 (31), pp. 5246 - 5249 (2008)

Wang, Y. H.; Dumke, R.; Zhang, J.; Liu, T.; Stejskal, A.; Zhao, Y. N.; Lu, Z. H.; Wing, L. J.; Becker, T.; Walther, H.: Absolute frequency and isotope shift measurements of the cooling transition in singly ionized indium. European Physical Journal D 44 (2), pp. 307 - 311 (2007)

Wang, Y. H.; Liu, T.; Dumke, R.; Stejskal, A.; Zhao, Y. N.; Zhang, J.; Lu, Z. H.; Wang, L. J.; Becker, T.; Walther, H.: Improved Absolute Frequency Measurement of the ¹¹⁵In⁺ 5s^{2 1}S₀-5s5p ³P₀ Narrowline Transition: Progress Towards an Optical Frequency Standard¹. Laser Physics 17 (7), pp. 1017 - 1024 (2007)

Wang, Y. H.; Dumke, R.; Liu, T.; Stejskal, A.; Zhao, Y. N.; Zhang, J.; Lu, Z. H.; Wang, L. J.; Becker, T.; Walther, H.: Absolute frequency measurement and high resolution spectroscopy of ¹¹⁵In⁺ 5s^{2 1}S₀-5s5p ³P₀ narrowline transition. Optics Communications 273 (2), pp. 526 - 531 (2007)

Liu, T.; Wang, Y.; Dumke, R.; Stejskal, A.; Zhao, Y.; Zhang, J.; Lu, Z.; Wang, L.; Becker, T.; Walther, H.: Narrow linewidth light source for an ultraviolet optical frequency standard. Applied Physics B 87 (2), pp. 272 - 232 (2007)

Rinner, S.; Werner, E.; Becker, T.; Walther, H.: Erratum: Decoherence measurement of two coupled micromasers. Physical Review A 74 (4), 041802 (2006)

Walther, H.; Varcoe, B. T. H.; Englert, B.-G.; Becker, T.: Cavity quantum electrodynamics. Reports on Progress in Physics 69 (5), pp. 1325 - 1382 (2006)

Schwedes, C.; Becker, T.; von Zanthier, J.; Walther, H.; Peik, E.: Laser sideband cooling with positive detuning. Physical Review A 69 (5), 053412 (2004)

Klembovsky, M. P.; Gorodetsky, M. L.; Becker, T.; Walther, H.: Quantum bit detector. JETP Letters 79 (9), pp. 441 - 444 (2004)

Sarkisyan, D.; Becker, T.; Papoyan, A.; Thoumany, P.; Walther, H.: Sub-Doppler fluorescence on the atomic D-2 line of a submicron rubidium-vapor layer. Applied Physics B-Lasers and Optics 76 (6), pp. 625 - 631 (2003)

Becker, T.; von Zanthier, J.; Peik, E.; Tamm, C.: Optische Frequenznormale mit gespeicherten Ionen. Physik Journal 1 (3), pp. 47 - 53 (2002)

Bernhardt, B.; Sorokin, E.; Jacquet, P.; Thon, R.; Becker, T.; Sorokina, I. T.; Hänsch, T. W.; Picqué, N.: 2.4 μm Dual-Comb Spectroscopy. In: Conference on Lasers and Electro-Optics (CLEO)/ Quantum Electronics and Laser Science Conference (QELS). Conference on Lasers and Electro-Optics (CLEO)/ Quantum Electronics and Laser Science Conference (QELS), San Jose, CA, May 16, 2010 - May 21, 2010. OSA, Washington (2010)

Becker, T.; Eichenseer, M.; Nevsky, A. Y.; Peik, E.; Schwedes, C.; Skvortsov, M. N.; von Zanthier, J.; Walther, H.: High Resolution Spectroscopy of a Single In⁺ Ion. In: Proceedings of the 6th Symposium on Frequency Standards and Metrology, pp. 107 - 114 (Ed. Gill, P.). 6th Symposium on Frequency Standards and Metrology, St. Andrews Univ., Fife, Scotland, September 09, 2001 - September 14, 2001. World Scientific, New Jersey (2002)

Becker, T. A.: Hochauflösende Spektroskopie gespeicherter Indium Ionen. Dissertation, LMU, München (2002)