Theory Seminar: Protecting Trapped Ions Against Faults

Prof. Marko Cetina (Duke University Department of Physics and University of Maryland Department of Physics):
I will present our results on the fault-tolerant preparation, measurement, rotation, and stabilizer measurement of a Bacon-Shor logical qubit using 13 trapped ion qubits [1].

Prof. Marko Cetina (Duke University Department of Physics and University of Maryland Department of Physics)
Group seminar via zoom
Wed, 15 December 2021, 15:00 pm (MEZ)

Abstract:

I will present our results on the fault-tolerant preparation, measurement, rotation, and stabilizer measurement of a Bacon-Shor logical qubit using 13 trapped ion qubits [1]. Comparing fault-tolerant protocols to non-fault tolerant protocols, we see significant reductions in the error rates of the logical primitives in the presence of noise. The result of fault-tolerant design is an average state preparation and measurement error of 0.6%, a Clifford gate error of 0.3% after error correction. I will also discuss a variant of the Shor code that is robust to idling errors caused by laser noise and magnetic field fluctuations and present measurements that show a factor of 4 improvement of the coherence time of the logical memory [2]. Finally, I will discuss the leading noise sources in our trapped-ion platform and our strategies to address these.

[1] L. Egan et al., Nature 598,  pp. 281-286 (2021)
[2] D. Debroy et al., arXiv:2105.05068<https://arxiv.org/abs/2105.05068>  (2021)

If you'd like to participate in the seminar, please contact us!